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Updated: Jun 15, 2026

Experimental Methods for Trapping Ions Using Microfabricated Surface Ion Traps
Published on: August 17, 2017
Electron beam ion source and electron beam ion trap (invited)
Reinard Becker1, Oliver Kester
1Scientific Software Service, Kapellenweg 2a, D-63571 Gelnhausen, Germany. rbecker@egun-igun.com
Abstract:
The electron beam ion source (EBIS) and its trap variant [electron beam ion trap (EBIT)] celebrated their 40th and 20th anniversary, respectively, at the EBIS/T Symposium 2007 in Heidelberg. These technologically challenging sources of highly charged ions have seen a broad development in many countries over the last decades. In contrast to most other ion sources the recipe of improvement was not "sorcery" but a clear understanding of the physical laws and obeying the technological constraints. This review will report important achievements of the past as well as promising developments in the future.
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