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Fine-structure characteristics in the emittance images of a strongly focusing He+ beam
1Graduate School of Engineering, Tohoku University, Sendai, Miyagi 980-8579, Japan.
Abstract:
The phase space distribution of a strongly focused He(+) ion beam source equipped with concave multiaperture electrodes was measured using a pepper-pot plate and a Kapton foil. The substructure of 301 merging He beamlets was clearly observed on a footprint of pepper-pot hole at the beam waist, where the beam density was 500 mA/cm(2). The position and the width of each beamlet substructure show the effect of interference of beamlets with surrounding one.
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