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Updated: Jun 15, 2026

Implementation of a Reference Interferometer for Nanodetection
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Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Rapid phase-shifting fiber interferometer with optical stylus.

H Martin1, X Jiang

  • 1University of Huddersfield, Queensgate, Huddersfield HD1 3DH, UK.

Optics Letters
|March 3, 2010
PubMed
Summary
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This study presents a stabilized fiber interferometer for precise surface measurements. It overcomes environmental disturbances using dual-wavelength multiplexing and real-time phase calculation.

Area of Science:

  • Optics and Photonics
  • Metrology
  • Fiber Optic Sensing

Background:

  • Optical fiber interferometry offers advantages for online high-precision surface measurement.
  • Environmental factors like temperature drift and vibration can destabilize interferometers.
  • Active stabilization is crucial for reliable performance in demanding applications.

Purpose of the Study:

  • To report a novel fiber interferometer utilizing a wavelength-scanning probe.
  • To investigate a stabilization method for optical fiber interferometers.
  • To demonstrate the effectiveness of the proposed method against environmental perturbations.

Main Methods:

  • Development of a fiber interferometer with a wavelength-scanning probe.
  • Implementation of a stabilization technique involving multiplexing dual wavelengths into a single fiber.

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Last Updated: Jun 15, 2026

Implementation of a Reference Interferometer for Nanodetection
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Published on: April 26, 2014

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source
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  • Utilizing rapid phase shifting and real-time phase calculation for dynamic compensation.

    • Main Results:

    • Successful stabilization of the fiber interferometer was achieved.
    • The interferometer demonstrated robustness against environmental perturbations.
    • Experimental data validated the effectiveness of the proposed stabilization method.

    Conclusions:

    • The developed fiber interferometer with wavelength-scanning probe is effectively stabilized.
    • The dual-wavelength multiplexing and real-time phase calculation method ensures reliable high-precision surface measurements.
    • This technique provides a robust solution for optical metrology in challenging environments.