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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon

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Refractive index changes in germanium due to intense radiation

T A Wiggins, J A Bellay, A H Carrieri

    Applied Optics
    |March 4, 2010
    PubMed

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