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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Refractive index measurements of a germanium sample
Applied Optics
|March 4, 2010
Summary
Refractive index measurements of germanium prisms in the 8-14 micrometer range were consistent between two labs. Results agreed within 0.0003, validating the experimental uncertainty analysis for this optical material.
Area of Science:
- Optics and Photonics
- Materials Science
Background:
- Germanium is a critical material for infrared optics.
- Accurate refractive index data is essential for optical design and performance prediction.
Purpose of the Study:
- To accurately measure the refractive index of a germanium prism.
- To validate measurements across independent laboratories.
- To assess the reliability of refractive index data for infrared applications.
Main Methods:
- Refractive index measurement of a germanium prism using two distinct laboratory setups.
- Utilizing a single crystal sample with well-documented purity and growth history.
- Employing precise wavelength control in the 8-14 micrometer range.
Main Results:
- Consistent refractive index values were obtained from both laboratories.
- Measurements from the two experiments agreed within a deviation of 0.0003.
- The observed agreement aligns with the presented uncertainty analysis.
Conclusions:
- The refractive index of germanium in the 8-14 micrometer range is reliably measurable.
- Independent laboratory measurements confirm the accuracy and reproducibility of the data.
- The findings support the use of germanium in demanding infrared optical systems.

