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Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Refractive index measurements of a germanium sample
Applied Optics
|March 4, 2010
Abstract:
The refractive index of a germanium prism was measured by two different laboratories for wavelengths in the 8-14-microm range. The sample was a single crystal of known purity and growth history. Index results from the two experiments agreed to within 0.0003 in agreement with the uncertainty analysis presented.
