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Updated: Jun 15, 2026

Picometer-Precision Atomic Position Tracking through Electron Microscopy
Published on: July 3, 2021
Koji Kimoto1, Toru Asaka, Xiuzhen Yu
1National Institute for Materials Science (NIMS), 1-1 Namiki, Tsukuba, Ibaraki 305-0044, Japan. kimoto.koji@nims.go.jp
Scanning transmission electron microscopy (STEM) enables picometer-scale crystal structure analysis. Advanced annular dark-field (ADF) imaging techniques improve resolution and accuracy for atomic measurements.
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