Related Experiment Video

Updated: Jun 15, 2026

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films
08:38

Electrospray Deposition of Uniform Thickness Ge23Sb7S70 and As40S60 Chalcogenide Glass Films

Published on: August 19, 2016

Scanning-electron-microscope-written gratings in chalcogenide films for optical integrated circuits.

Y Handa, T Suhara, H Nishihara

    Applied Optics
    |March 9, 2010
    PubMed
    Summary

    Researchers created novel optical components using electron-beam gratings in chalcogenide films. These gratings efficiently deflect and split guided light waves for integrated optics applications.

    More Related Videos

    Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System12:08

    Fabrication of High Contrast Gratings for the Spectrum Splitting Dispersive Element in a Concentrated Photovoltaic System

    Published on: July 18, 2015

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization07:50

    Electron Channeling Contrast Imaging for Rapid III-V Heteroepitaxial Characterization

    Published on: July 17, 2015

    Related Concept Videos

    Scanning Electron Microscopy01:07

    Scanning Electron Microscopy

    A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
    Fundamental Principles
    Accelerated...