Interference and Diffraction
Determination of Crystal Structures
X-ray Crystallography
Deflection of a Beam
Substitutions in Multiple Integrals
Trigonometric Substitution
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Leonid I Goray1, Gunther Schmidt
1I.I.G., Inc., P.O. Box 131611, Staten Island, New York 10313, USA. lig@pcgrate.com
This study presents a rigorous electromagnetic formulation for analyzing off-plane scattering from diffraction gratings. The developed method accurately calculates absorption and efficiencies for various grating types, proving efficient for complex scenarios.
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