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Updated: Jun 15, 2026

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)
10:42

In Depth Analyses of LEDs by a Combination of X-ray Computed Tomography (CT) and Light Microscopy (LM) Correlated with Scanning Electron Microscopy (SEM)

Published on: June 16, 2016

Current development and patents on high-brightness white LED for illumination

Wen-Yuan Pang1, Ikai Lo, Chia-Ho Hsieh

  • 1Department of Physics, Institute of Material Science and Engineering, Center for Nanoscience and Nanotechnology, National Sun Yat-Sen University, Kaohsiung, Taiwan 80424, Republic of China.

Recent Patents on Nanotechnology
|March 11, 2010
PubMed

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