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Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
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The Doppler effect and Doppler shift were named after the Austrian physicist and mathematician Christian Johann Doppler in 1842, who conducted experiments with both moving sources and moving observers. Consider an observer standing on a street corner, observing an ambulance with a siren sound passing by at a constant speed. The observer experiences two characteristic changes in the sound of the siren. Initially, the sound increases in loudness as the ambulance approaches and decreases in...

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Related Experiment Video

Updated: Jun 15, 2026

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
10:28

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Published on: July 5, 2016

Real-time digital heterodyne interferometry: a system.

N A Massie

    Applied Optics
    |March 11, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel system provides real-time optical path difference maps for optical phenomena and components. This technology achieves high speed and accuracy for advanced optical characterization.

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    Area of Science:

    • Optics
    • Optical Engineering
    • Metrology

    Background:

    • Accurate characterization of optical phenomena and components is crucial for advancing optical technologies.
    • Existing methods may lack the speed or precision required for real-time analysis.
    • Understanding thermal effects and active component behavior necessitates advanced measurement techniques.

    Purpose of the Study:

    • To describe a new system for real-time optical path difference (OPD) mapping.
    • To present applications of this system in characterizing optical phenomena and components.
    • To demonstrate the system's performance parameters.

    Main Methods:

    • Development of a system for real-time OPD map acquisition.
    • Application of the system to study thermally driven optical phenomena.
    • Utilization of the system for characterizing active optical components.

    Main Results:

    • The system enables real-time acquisition of optical path difference maps.
    • Demonstrated performance includes a serial data acquisition rate of 50 microseconds per point.
    • Achieved spatial resolution of 500 points per line and phase accuracy of lambda/70.

    Conclusions:

    • The developed system offers a powerful tool for real-time optical metrology.
    • It effectively characterizes dynamic optical phenomena and active optical components.
    • The demonstrated performance parameters meet demanding requirements for optical system analysis.