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Related Concept Videos

Chemical Shift: Internal References and Solvent Effects01:17

Chemical Shift: Internal References and Solvent Effects

In an NMR sample, precise measurement of the absolute absorption frequencies of nuclei is difficult. A standard internal reference compound is added, and the frequency difference between the reference signal and sample signals is measured.
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Implementation of a Reference Interferometer for Nanodetection
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Published on: April 26, 2014

NBS reference retroreflectometer.

K L Eckerle, J J Hsia, V R Weidner

    Applied Optics
    |March 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new long-range retroreflectance instrument measures photometric properties of retroreflectors. This device will form the basis for a Measurement Assurance Program (MAP) and Standard Reference Materials (SRM).

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    Area of Science:

    • Photometry
    • Optical Engineering
    • Metrology

    Background:

    • Accurate measurement of retroreflector photometric properties is crucial for various applications.
    • Existing instrumentation may have limitations in range or geometric flexibility.
    • The National Bureau of Standards (NBS) requires advanced tools for radiometric measurements.

    Purpose of the Study:

    • To design and construct a novel long-range retroreflectance instrument.
    • To enable the measurement of photometric properties across diverse geometries.
    • To establish a foundation for a Measurement Assurance Program (MAP) and Standard Reference Materials (SRM).

    Main Methods:

    • Detailed design and construction of a long-range retroreflectance instrument.
    • Testing and validation of the instrument's performance.
    • Characterization of photometric properties for various retroreflector samples.

    Main Results:

    • Successful development of a functional long-range retroreflectance instrument.
    • Demonstration of the instrument's capability to measure photometric properties for different geometries.
    • Estimation of uncertainties associated with measurements on typical samples.

    Conclusions:

    • The developed instrument meets the needs of the measurement community.
    • The instrument is suitable for use as a basis for a Measurement Assurance Program (MAP).
    • The instrument can support the development of Standard Reference Materials (SRM) for retroreflectors.