Jove
Visualize
Contact Us

Related Concept Videos

Spectrophotometry: Introduction01:16

Spectrophotometry: Introduction

Spectrophotometry is the quantitative measurement of the absorption, reflection, diffraction, or transmission of electromagnetic radiation through a material as a function of the intensity and wavelength of the radiation. A spectrophotometer is a device used to measure the change in the radiation intensity caused by its interaction with the material.
The essential components of a spectrophotometer include a source of electromagnetic radiation, a slot for placing a material to be analyzed, and a...
UV–Vis Spectrometers01:14

UV–Vis Spectrometers

The absorbance of UV and visible (UV–visible) radiations is measured using a UV–visible spectrophotometer. Deuterium lamps, which emit UV radiation, and tungsten lamps, which produce radiation in the visible region, are used as light sources in UV–visible spectrophotometers. A monochromator or prism is used for diffraction grating, i.e., to split the incoming radiation into different wavelengths. A system of slits is used to focus the desired wavelength on the sample cell. Samples for...
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Atomic Absorption Spectroscopy: Instrumentation01:22

Atomic Absorption Spectroscopy: Instrumentation

An atomic absorption spectrophotometer (AAS) comprises several components: a radiation source, an atomizer, a monochromator, and a detector. The radiation source can be a hollow-cathode lamp (HCL) or an electrodeless-discharge lamp (EDL), both of which provide a narrow emission line of the required wavelength. However, some instruments use continuum sources and high-resolution monochromators to achieve a narrow range of radiation.
The atomizer used in AAS can be either a flame atomizer or an...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Sintered mixtures of phosphors in polytetra-fluoroethylene resin for fluorescence standards.

Applied optics·2010
Same author

Gray scale of diffuse reflectance for the 250-2500-nm wavelength range.

Applied optics·2010
Same author

Heterochromatic stray light in UV absorption spectrometry: a new test method.

Applied optics·2010
Same author

NBS reference retroreflectometer.

Applied optics·2010
Same author

NBS reference hazemeter: its development and testing.

Applied optics·2010
Same author

Averaging sphere for ultraviolet, visible, and near infrared wavelengths: a highly effective design.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Experiment Video

Updated: Jun 15, 2026

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
07:55

High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

Published on: September 22, 2017

NBS specular reflectometer-spectrophotometer.

V R Weidner, J J Hsia

    Applied Optics
    |March 12, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A new specular reflectometer calibrates mirror standards from 250-2500 nm. This instrument offers precise absolute reflectance measurements with an uncertainty of +/-0.2%.

    More Related Videos

    Evaluation of Photosynthetic Behaviors by Simultaneous Measurements of Leaf Reflectance and Chlorophyll Fluorescence Analyses
    10:20

    Evaluation of Photosynthetic Behaviors by Simultaneous Measurements of Leaf Reflectance and Chlorophyll Fluorescence Analyses

    Published on: August 9, 2019

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis
    10:35

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis

    Published on: October 17, 2016

    Related Experiment Videos

    Last Updated: Jun 15, 2026

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis
    07:55

    High-speed Continuous-wave Stimulated Brillouin Scattering Spectrometer for Material Analysis

    Published on: September 22, 2017

    Evaluation of Photosynthetic Behaviors by Simultaneous Measurements of Leaf Reflectance and Chlorophyll Fluorescence Analyses
    10:20

    Evaluation of Photosynthetic Behaviors by Simultaneous Measurements of Leaf Reflectance and Chlorophyll Fluorescence Analyses

    Published on: August 9, 2019

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis
    10:35

    Multimodal Imaging and Spectroscopy Fiber-bundle Microendoscopy Platform for Non-invasive, In Vivo Tissue Analysis

    Published on: October 17, 2016

    Area of Science:

    • Optical Engineering
    • Metrology
    • Spectrophotometry

    Background:

    • Accurate calibration of mirror standards is crucial for reliable optical measurements.
    • Existing spectrophotometers often measure diffuse or fixed-angle reflectance, necessitating specialized instruments for specular measurements.

    Purpose of the Study:

    • To develop and validate a specular reflectometer for calibrating mirror standards.
    • To extend reflectance calibration capabilities across a broad spectral range (250-2500 nm) and various angles of incidence.

    Main Methods:

    • Construction of a specular reflectometer as an accessory to a reference spectrophotometer.
    • Utilized a beam tracking system and a signal averaging sphere for absolute reflectance measurements.
    • Employed a computer-controlled turntable for precise control of the optical system at incidence angles from 5 to 80 degrees.

    Main Results:

    • The instrument successfully calibrates mirror standards within the 250-2500 nm spectral range.
    • Demonstrated the capability to measure reflectance at various angles of incidence using polarized radiation.
    • Achieved low measurement uncertainties of +/-0.2% for absolute reflectance.

    Conclusions:

    • The developed specular reflectometer provides a reliable and accurate method for calibrating mirror standards.
    • This instrument enhances the capabilities of reference spectrophotometers for comprehensive optical property characterization.
    • The system's design ensures high precision and versatility in specular reflectance measurements.