Inductively Coupled Plasma–Mass Spectrometry (ICP–MS): Overview
Inductively Coupled Plasma Atomic Emission Spectroscopy: Principle
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Updated: Jun 15, 2026

In Situ SIMS and IR Spectroscopy of Well-defined Surfaces Prepared by Soft Landing of Mass-selected Ions
Published on: June 16, 2014
A Pichard1, P Jardin, M-G Saint-Laurent
1GANIL, Bd Henri Becquerel, BP 55027, 14076 Caen Cedex 5, France. pichard@ganil.fr
Researchers developed a new method to measure the efficiency and response time of target ion sources (TISs) for radioactive beam production. This technique optimizes yields for short-lived isotopes, crucial for projects like SPIRAL 2.
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