Related Experiment Video
Updated: Jun 15, 2026

A Technical Guide for Performing Spectroscopic Measurements on Metal-Organic Frameworks
Published on: April 28, 2023
Extended absorption fine structure studies above the carbon, nitrogen, oxygen, and fluorine K absorption edges
Abstract:
Absorption measurements above the K edges of the low-Z atoms, C, N, O, and F, are discussed, which utilize 250-1000-eV synchrotron radiation. The paper emphasizes experimental procedures of soft x-ray absorption and extended absorption fine structure (EXAFS) measurements as well as applications and future prospects of such studies. In particular, we discuss such applications as surface EXAFS, surface absorption fine structure, and ion yield EXAFS measurements.
Related Concept Videos
IR Frequency Region: Fingerprint Region
The...
Molecular Spectroscopy: Absorption and Emission
IR and UV–Vis Spectroscopy of Aldehydes and Ketones
Atomic Spectroscopy: Absorption, Emission, and Fluorescence
IR Frequency Region: X–H Stretching
Spectroscopy of Carboxylic Acid Derivatives
In the...

