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Updated: Jun 14, 2026

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High-spatial-resolution nulling microellipsometer using rotational polarization symmetry.

Alain Tschimwang1, Qiwen Zhan

  • 1Electro-Optics Program, University of Dayton, 300 College Park, Dayton, Ohio 45469, USA. tschiman@notes.udayton.edu

Applied Optics
|March 20, 2010
PubMed
Summary

We developed a high-resolution nulling microellipsometer for precise surface measurements. This instrument achieves 0.48 micrometer lateral spatial resolution, advancing microscale surface analysis.

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Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures

Published on: November 21, 2019

Area of Science:

  • Optics and Photonics
  • Materials Science
  • Nanotechnology

Background:

  • Ellipsometry is a powerful technique for characterizing thin films and surfaces.
  • Traditional microellipsometry faces challenges in achieving high spatial resolution and signal-to-noise ratio.
  • Improving signal-to-noise ratio is crucial for accurate spatially resolved ellipsometric measurements.

Purpose of the Study:

  • To design and experimentally test a novel high-spatial-resolution nulling microellipsometer.
  • To leverage rotational polarization symmetry for enhanced measurement accuracy.
  • To demonstrate the capability of surface profiling for microstructures.

Main Methods:

  • The microellipsometer design incorporates an electro-optic polarization rotator.
  • A null detection scheme is implemented for improved signal-to-noise ratio.
  • Rotational polarization symmetry principles are utilized for spatially resolved measurements.

Main Results:

  • The nulling microellipsometer was successfully designed and experimentally tested.
  • Surface profiling of a lithographically patterned microstructure was demonstrated.
  • A lateral spatial resolution of 0.48 micrometers was achieved with a numerical aperture of 0.9 and a wavelength of 632.8 nm.

Conclusions:

  • The developed nulling microellipsometer offers high spatial resolution for microscale surface analysis.
  • The integration of an electro-optic polarization rotator and null detection enhances measurement capabilities.
  • This technology provides a valuable tool for characterizing micro- and nanostructured surfaces.