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Characterization of optical constants for uranium from 10 to 47 nm
Nicole Brimhall1, Nicholas Herrick, David D Allred
1Department of Physics and Astronomy, Brigham Young University, Provo, Utah 84602, USA.
Abstract:
We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measured ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation prevented its careful characterization previous to this study. We find that measured optical constants for uranium vary significantly from previous estimates.
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