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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Interference and Superposition of Waves01:07

Interference and Superposition of Waves

When two waves of the same nature occur in the same region simultaneously, they result in interference. Interference of waves implies that the net effect of the waves is the sum of the individual waves' effects. However, it does not imply that the individual waves affect the propagation of other waves.
Interference occurs in mechanical waves, such as sound waves, waves on a string, and surface water waves. Mechanical waves correspond to the physical displacement of particles. Hence,...
IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Shear on the Horizontal Face of a Beam Element01:16

Shear on the Horizontal Face of a Beam Element

To understand shear on the flat side of a prismatic beam element, consider the vertical and horizontal shearing forces, and the normal forces, acting on the element. The element's upper (U) and lower (L) sections, which are divided by the beam's neutral axis, are examined. The equilibrium of these forces is determined by applying the equilibrium equation, which helps identify the horizontal shearing force. This force is directly related to the bending moments and the cross-section's first...
Phase Contrast and Differential Interference Contrast Microscopy01:26

Phase Contrast and Differential Interference Contrast Microscopy

Phase-Contrast Microscopes
In-phase-contrast microscopes, interference between light directly passing through a cell and light refracted by cellular components is used to create high-contrast, high-resolution images without staining. It is the oldest and simplest type of microscope that creates an image by altering the wavelengths of light rays passing through the specimen. Altered wavelength paths are created using an annular stop in the condenser. The annular stop produces a hollow cone of...
Atomic Absorption Spectroscopy: Interference01:25

Atomic Absorption Spectroscopy: Interference

Interference leads to systematic error in atomic absorption (AA) measurements by enhancing or diminishing the analytical signal or the background. These interferences can be grouped into three main categories: spectral interference, chemical interference, and physical interference.
Spectral interference occurs when signals from other elements or molecules overlap with the analyte signal, falsely elevating or masking the analyte's absorbance. This interference can be corrected using Zeeman,...

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Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
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Published on: May 23, 2017

Superposition fringe shear interferometer.

J Schwider

    Applied Optics
    |March 24, 2010
    PubMed
    Summary
    This summary is machine-generated.

    A novel superposition fringe shear interferometer (SFSI) allows for precise measurement of optical aberrations, including chromatic aberrations. This mechanically stable instrument provides clear shear interferograms for detailed optical testing.

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    Area of Science:

    • Optical physics
    • Interferometry
    • Aberration measurement

    Background:

    • Accurate measurement of optical aberrations is crucial for lens design and performance evaluation.
    • Existing interferometric methods may have limitations in versatility or precision for certain aberration types.

    Purpose of the Study:

    • To introduce a new white light shear interferometer utilizing superposition fringes.
    • To demonstrate the capability of the SFSI for measuring various optical aberrations, including chromatic and other types.
    • To present test examples, specifically analyzing the secondary spectrum of a microscope objective.

    Main Methods:

    • Development of a superposition fringe shear interferometer (SFSI) using white light.
    • Utilizing interference filters to obtain shear interferograms.
    • Spectroscopic dispersion of shear interferogram sections to display chromatic aberrations.
    • Adjusting the mean phase difference by tilting interferometer etalons.

    Main Results:

    • The SFSI successfully measures plane waves and various aberrations.
    • Chromatic aberrations are visualized by spectroscopically dispersing slit sections of the interferogram.
    • The secondary spectrum of a microscope objective was successfully measured as a test case.
    • The interferometer setup is mechanically stable, ensuring reliable measurements.

    Conclusions:

    • The SFSI is a versatile and stable instrument for comprehensive optical aberration testing.
    • The method allows for detailed analysis of chromatic aberrations.
    • The SFSI provides a valuable tool for optical metrology and lens characterization.