Infrared He-Xe laser interferometry for measuring length

Area of Science:

• Metrology and Measurement Science
• Optical Physics

Background:

• Accurate absolute length measurements are crucial in various scientific and industrial applications.
• Existing techniques may have limitations in range or accuracy.

Purpose of the Study:

• To develop a novel technique for determining absolute lengths up to 3 meters.
• To analyze the accuracy requirements for wavelength ratios and fringe fraction readings.
• To create a cost-effective laser source for high-accuracy interferometry.

Main Methods:

• Interferometric measurement using interference fringe fractions.
• Simultaneous operation of a He-Xe laser at two wavelengths (3.51 µm and 3.37 µm).
• Analysis of required accuracies for wavelength ratios and fringe fraction readings.

Main Results:

• A technique for absolute length determination up to 3 m was established.
• The study analyzed the critical parameters affecting measurement accuracy.
• A stabilized He-Xe laser was successfully developed and utilized for preliminary measurements.

Conclusions:

• The developed technique offers a viable method for extending absolute length measurements.
• The stabilized He-Xe laser meets the accuracy demands for this interferometric technique.
• Further refinement of wavelength ratios and fringe fraction readings can enhance measurement precision.