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Vacuum ultraviolet Mach-Zehnder interferometer with CaF(2) optics.

P L Smith, G G Lombardi, B L Cardon

|March 24, 2010

Summary

This summary is machine-generated.

Researchers measured atomic xenon oscillator strength using a VUV Mach-Zehnder interferometer with CaF(2) optics. The hook method yielded a result consistent with other techniques, suggesting future routine measurements above 150 nm.

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Area of Science:

Atomic Physics
Spectroscopy
Optical Interferometry

Background:

Accurate measurement of atomic spectral line properties is crucial for understanding atomic structure and processes.
Vacuum Ultraviolet (VUV) spectroscopy presents unique challenges due to the high energy and absorption of VUV radiation.

Purpose of the Study:

To test the performance of a VUV Mach-Zehnder interferometer equipped with CaF(2) optics.
To measure the oscillator strength of a specific atomic xenon line using the hook method.

Main Methods:

Utilized a VUV Mach-Zehnder interferometer with CaF(2) optics.
Employed the hook method to determine oscillator strength.
Measured the oscillator strength of the 146.9610-nm (1)S(0)-(3)P(0)(1) line of atomic xenon.

Main Results:

The oscillator strength for the targeted xenon line was determined to be f = 0.244 +/- 0.015.
The obtained result shows good agreement with values derived from other experimental techniques.

Conclusions:

The VUV Mach-Zehnder interferometer with CaF(2) optics is suitable for routine oscillator strength measurements using the hook method for wavelengths above approximately 150 nm.
Measurements below 150 nm require more intense VUV continuum sources for reliable application of this technique.