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Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
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To achieve precise distance measurements, especially in surveying and construction, certain corrections must be applied to account for potential sources of error like the standardization errors, temperature variations, and slope adjustments.Standardization error emerges when measurement equipment undergoes changes, such as wear, repairs, or weather impacts. To address this, surveyors compare the equipment’s readings to a standard. This process identifies any deviation that might lead to...
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Related Experiment Video

Updated: Jun 14, 2026

Experiments on Ultrasonic Lubrication Using a Piezoelectrically-assisted Tribometer and Optical Profilometer
09:21

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Defect measurements in digital optical disks.

D Y Lou, A Martinez

    Applied Optics
    |March 24, 2010
    PubMed
    Summary

    This study presents a novel method for optical disk defect analysis by examining pulse width distributions. This technique accurately predicts disk quality and identifies substrate defects, crucial for manufacturing unrecorded optical media.

    Area of Science:

    • Materials Science
    • Optical Engineering
    • Data Analysis

    Background:

    • Optical disk manufacturing requires stringent quality control to minimize data errors.
    • Characterizing defects on unrecorded media is essential for predicting final product performance.
    • Existing methods may not fully capture substrate-related defect origins.

    Purpose of the Study:

    • To develop and validate a method for characterizing defects on unrecorded optical disks.
    • To correlate defect density measurements with actual data recording quality (bit error rates).
    • To investigate the role of uncoated substrates in defect formation on coated disks.

    Main Methods:

    • Analyzing the statistical distribution of pulse widths obtained during playback of unrecorded optical disks.

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  • Correlating measured defect densities with bit error rates from subsequent recordings.
  • Applying the method to both coated and uncoated disk substrates.

    • Main Results:

    • A strong correlation was established between defect densities measured by pulse width analysis and bit error rates.
    • The method effectively characterizes defects on unrecorded optical disks and uncoated substrates.
    • Defects on tellurium-coated disks were found to predominantly originate from the underlying uncoated substrates.

    Conclusions:

    • The described pulse width analysis method provides a reliable, non-destructive way to assess optical disk quality.
    • This technique is valuable for identifying and mitigating defects originating from substrates, improving overall disk manufacturing.
    • The findings offer insights into defect propagation in coated optical media.