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Optical Scatter Microscopy Based on Two-Dimensional Gabor Filters
Published on: June 2, 2010
Two-stage spatial filtering for diffraction pattern analysis
Applied Optics
|March 24, 2010
Abstract:
The use of optical power spectrum analysis for feature detection and classification is often restricted by the superposition of the aperture spectrum. A spatial frequency filtering technique using a circular aperture and filters has been previously proposed to separate the object and aperture spectra. An adaptation of this technique using square apertures and an opaque cross spatial filter offers improved performance for some applications. Numerical calculations and experimental results are given comparing the two techniques.

