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Updated: Jun 14, 2026

Theoretical Calculation and Experimental Verification for Dislocation Reduction in Germanium Epitaxial Layers with Semicylindrical Voids on Silicon
Published on: July 17, 2020
Dislocation-induced local modulation of the surface states of Ag(111) thin films on Si(111) 7 x 7 substrates
Keiichi Sawa1, Yuki Aoki, Hiroyuki Hirayama
1Department of Materials Science and Engineering, Tokyo Institute of Technology, J1-3, 4259 Nagatsuda, Midori-ku, Yokohama 226-8502, Japan.
Abstract:
Local modulation of the Shockley-type surface state was studied around threading dislocations at the surfaces of ultrathin Ag(111) epitaxial films on Si(111) substrates. Scanning tunneling microscope (STM) observations indicated that the wavelength of the surface state electron was shortened around the dislocations in the electron standing wave pattern. Scanning tunneling spectroscopy (STS) revealed that the bottom of the local surface state (E0) shifts downward around the dislocation. The shift in E0 and the lattice displacement Delta u(z) have a linear relation, which indicates that the shift of the surface state is caused by local relaxation of the misfit strain around the dislocation.

