Influence of phase transformation on stress evolution during growth of metal thin films on silicon

A Fillon1, G Abadias, A Michel

  • 1Institut P', CNRS-Université de Poitiers-ENSMA, Département Physique et Mécanique des Matériaux, SP2MI-Téléport 2, F86962 Futuroscope-Chasseneuil cedex, France.

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