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Updated: Jun 14, 2026
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Elemental-sensitive Detection of the Chemistry in Batteries through Soft X-ray Absorption Spectroscopy and Resonant Inelastic X-ray Scattering
Published on: April 17, 2018
Surface sensitivity in scanning transmission x-ray microspectroscopy using secondary electron detection.
1Physikalische Chemie II and ICMM, Universität Erlangen-Nürnberg, 91058 Erlangen, Germany.
The Review of Scientific Instruments
|April 8, 2010
Summary
This study integrates electron detection into scanning transmission x-ray microspectroscopy (STXM), enhancing surface sensitivity. This advancement allows for detailed surface analysis previously unavailable with bulk-sensitive x-ray detection methods.
Area of Science:
- Materials Science
- Spectroscopy
- Surface Science
Background:
- Scanning transmission x-ray microspectroscopy (STXM) traditionally offers bulk sensitivity.
- High lateral resolution is a key feature of STXM.
- Limitations exist in probing sample surfaces with conventional x-ray detection.
Purpose of the Study:
- To demonstrate the successful integration of electron detection into an STXM.
- To enhance the surface sensitivity of STXM.
- To enable detailed surface analysis using secondary electron detection.
Main Methods:
- Implementation of a channeltron electron multiplier for electron detection.
- Utilizing resonant excitation for secondary electron emission.
- Developing correction schemes for self-absorption in thicker specimens.
Main Results:
- Successful integration of electron detection into STXM.
- Achieved enhanced surface sensitivity by detecting secondary electrons.
- Established methods to correct for self-absorption artifacts.
Conclusions:
- Electron detection significantly expands STXM capabilities.
- The enhanced STXM provides a powerful tool for surface-sensitive analysis.
- The developed methods are crucial for accurate characterization of materials.
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