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Related Concept Videos

X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
The Seven Crystal Systems: Overview01:24

The Seven Crystal Systems: Overview

Crystals with various point group symmetries belong to different crystal classes, which are synonymous terms. Despite being in the same class, crystals may have distinct shapes, like cubes and octahedra. There are 32 three-dimensional point groups, all of which are systematically divided into seven crystal systems.The basic cubic crystal system, exemplified by NaCl, features orthogonal vectors (α = β = �� = 90°) of equal lengths (a = b = c). When specific requirements are not imposed on the...
Sign Convention01:30

Sign Convention

When analyzing a beam subjected to various loads, it is crucial to understand the internal forces and moments generated within the structure. These internal forces can be broadly classified into normal forces, shear forces, and bending moments. To determine these forces and moments, we use the method of sections and apply a specific sign convention based on their direction and the side of the section being analyzed.
The normal force acts perpendicular to the beam's cross-section and can cause...
Law of Rational Indices01:29

Law of Rational Indices

The Law of rational indices is a fundamental principle in the field of crystallography. According to this law, the intercepts of a crystal face along the crystallographic axes (the three-dimensional axes along which a crystal is measured) can be expressed as either equivalent to the unit intercepts (a, b, c) or simple whole number multiples of them. These multiples are typically denoted as na, n'b, and n''c, where n, n', and n'' are simple whole numbers.To illustrate, consider a crystal with...

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Related Experiment Video

Updated: Jun 14, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Diffraction gratings: a sign convention on order numbers for use in a computer program.

M E Wilson

    Applied Optics
    |April 8, 2010
    PubMed
    Summary

    A new method simplifies determining the sign of diffraction grating order numbers in computer-based ray tracing. This approach ensures accurate optical system modeling by verifying results against commercial software.

    Area of Science:

    • Optics
    • Computational Science
    • Optical Engineering

    Background:

    • Accurate modeling of optical systems with diffraction gratings is crucial in ray tracing.
    • A consistent sign convention for diffraction grating order numbers is essential for computational accuracy.
    • Existing commercial software may have varying implementations of these conventions.

    Purpose of the Study:

    • To introduce a straightforward method for determining the sign of diffraction grating order numbers.
    • To validate the proposed method by comparing its results with established commercial ray tracing programs.

    Main Methods:

    • Development of a novel algorithm for assigning signs to diffraction grating orders.
    • Implementation and testing of the method within a ray tracing framework.

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    Published on: July 18, 2015

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    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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    Published on: October 11, 2016

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  • Comparative analysis against outputs from multiple commercial optical design software packages.
  • Main Results:

    • The proposed method provides an easy and reliable way to determine the correct sign convention.
    • Consistent results were observed between the new method and tested commercial software.
    • Identified potential discrepancies in sign conventions across different software implementations.

    Conclusions:

    • The presented method enhances the accuracy and reliability of ray tracing simulations involving diffraction gratings.
    • It serves as a valuable tool for optical engineers to ensure correct interpretation of diffraction orders.
    • Promotes standardization and reduces errors in computational optical design.