X-ray Crystallography
Determination of Crystal Structures
The Seven Crystal Systems: Overview
Sign Convention
Law of Rational Indices
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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
Published on: October 11, 2016
A new method simplifies determining the sign of diffraction grating order numbers in computer-based ray tracing. This approach ensures accurate optical system modeling by verifying results against commercial software.
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