Micron-scale 3D imaging of wood and plant microstructure using high-resolution X-ray phase-contrast microtomography

The structure of wood on a range of length-scales is critical to the performance and properties of this industrially important natural material. Much analysis of wood on the micron-scale upwards is carried out in two dimensions using optical microscopy. In recent years, however, three-dimensional (3D) analysis using X-ray microtomography has proved to be of increasing interest, providing volumetric data without the risk of damage from physical sectioning. In the present work we explore the potential of laboratory-based phase-contrast X-ray microtomography for analysis of wood microstructure on the micron scale. 3D datasets with quality enhanced by the use of phase-contrast, have been obtained for a number of different wood specimens. Segmentation of the datasets followed by different types of quantitative analysis is also successfully demonstrated, confirming the value of this technique for high-resolution analysis of 3D wood microstructure.