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Production of Single Tracks of Ti-6Al-4V by Directed Energy Deposition to Determine the Layer Thickness for Multilayer Deposition
Published on: March 13, 2018
Refining method for the design of multilayer stacks
F Demichelis1, G Ferrari, E Minetti-Mezzetti
1Centro Ricerche Fiat, Torino, Italy.
Applied Optics
|April 15, 2010
Abstract:
An analytical procedure is presented for the calculation of the maximum of transmittance in a limited spectral region and of the efficiency of a given multilayer configuration when the thickness is altered of certain films in the stack. This refining process method is employed in examples where the spectral transmittance is improved when only a few matching layers are used for refining.

