Aliasing
Tangent Planes to a Parametric Surface
Reconstruction of Signal using Interpolation
Linear Approximation in Frequency Domain
Topographic Surveying and Contours
Level Curves and Contour Maps
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Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization
Published on: July 5, 2016
1Yamanashi University, Precision Engineering Department, Takeda, Kofu 400, Japan.
This study introduces a novel contouring method using spatial frequency modulation and hologram interferometry to generate depth contours for objects. The technique offers continuously variable sensitivity and orientation, enabling high-precision depth measurements for diffuse surfaces.
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