Large-flux-ratio linearity measurements on Si photodiodes

Area of Science:

• Optical physics
• Semiconductor device characterization

Background:

• Traditional detector linearity tests use small flux steps, leading to cumulative uncertainties for large flux ratios.
• Accurate linearity assessment is crucial for photodiodes in high-dynamic-range applications.

Purpose of the Study:

• To develop and demonstrate a method for testing silicon (Si) photodiode linearity over large flux ratios.
• To mitigate uncertainties associated with conventional small-step linearity testing.

Main Methods:

• Generated large flux ratios by reflecting a laser beam off two fused quartz surfaces.
• Calculated the flux ratio based on the refractive index of fused quartz.
• Measured the response of a Si photodiode to the generated flux ratios.

Main Results:

• Successfully generated and utilized large flux ratios for photodiode linearity testing.
• Reported measurements on a single Si photodiode, demonstrating the method's applicability.

Conclusions:

• The laser reflection method provides a viable alternative for testing Si photodiode linearity at large flux ratios.
• This technique reduces the accumulation of uncertainties compared to traditional methods.