Related Experiment Video

Updated: Jun 13, 2026

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
06:56

Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

Published on: May 23, 2017

Infinite fringe moire deflectometry

O Kafri1, A Livnat, E Keren

  • 1Nuclear Research Centre-Negev, P.O. Box 9001, Beer Sheva, Israel 84109.

Applied Optics
|April 17, 2010
PubMed

More Related Videos

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization10:28

Compact Lens-less Digital Holographic Microscope for MEMS Inspection and Characterization

Published on: July 5, 2016

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques11:34

High-resolution, High-speed, Three-dimensional Video Imaging with Digital Fringe Projection Techniques

Published on: December 3, 2013

Related Concept Videos

Atomic Force Microscopy01:08

Atomic Force Microscopy

Atomic force microscopy (AFM) is a type of scanning probe microscopy that can analyze topographic details of various specimens like ceramics, glass, polymers, and biological samples. AFM offers over 1000 times more resolution than the optical imaging system. Images generated from AFM are three-dimensional surface profiles, offering an advantage over the flat, two-dimensional images from other imaging techniques.
The AFM Probe
The probe is regarded as the heart of any AFM setup and comprises the...