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Related Experiment Video

Updated: Jun 13, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Published on: April 4, 2017

Polynomial fit of interferograms.

|April 20, 2010

Summary

This study quantifies polynomial fit errors in interferograms. It explores orthonormal polynomials and methods for analyzing complex apertures and stitching subaperture data for surface figure error measurement.

Area of Science:

Optical Engineering
Metrology
Computational Optics

Background:

Interferometry is crucial for precise surface metrology.
Polynomial fitting is a common technique for analyzing interferogram data.
Understanding and mitigating fitting errors is essential for accurate measurements.

Purpose of the Study:

To quantitatively analyze errors associated with polynomial fitting of interferograms.
To present the advantages of using orthonormal polynomials in interferogram analysis.
To explore methods for analyzing noncircular apertures and stitching subaperture data.

Main Methods:

Quantitative analysis of polynomial fit errors (fit, digitization, roundoff, finite sampling).
Definition and comparison of best and relative reference wavefronts.

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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

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Related Experiment Videos

Last Updated: Jun 13, 2026

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Measurement of Quantum Interference in a Silicon Ring Resonator Photon Source

Published on: April 4, 2017

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

The Generation of Higher-order Laguerre-Gauss Optical Beams for High-precision Interferometry

Published on: August 12, 2013

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Simulation of Zernike polynomial fitting for annular aperture interferograms.

Introduction of a subaperture stitching method for surface figure error determination.

Main Results:

Errors inherent in polynomial fitting are systematically explained.
Orthonormal polynomials offer advantages for interferogram analysis.
Zernike polynomials can be simulated for annular apertures.
Subaperture stitching provides a viable method for large optic testing.

Conclusions:

Accurate interferogram analysis requires careful consideration of various polynomial fitting errors.
Orthonormal polynomials and appropriate reference wavefronts enhance measurement accuracy.
Advanced techniques like Zernike polynomial analysis and subaperture stitching extend interferometric capabilities.