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Quantum State Engineering of Light with Continuous-wave Optical Parametric Oscillators
Published on: May 30, 2014
Precise intracavity phase interferometry in an optical parametric oscillator with two pulses per cavity round trip
Andreas Velten1, Andreas Schmitt-Sody, Jean-Claude Diels
1Center for High Technology Materials, 1313 Goddard SE, Albuquerque, New Mexico 87106, USA.
Optics Letters
|April 23, 2010
Summary
Intracavity phase interferometry measures tiny phase shifts, equivalent to femtometer changes in cavity length. This sensitive technique offers higher accuracy for nonlinear refractive index measurements compared to traditional methods.
Area of Science:
- Optics and Photonics
- Nonlinear Optics
- Interferometry
Background:
- Precise measurement of optical phase shifts is crucial for characterizing nonlinear optical materials.
- Traditional methods like the z-scan technique have limitations in sensitivity and accuracy for certain measurements.
- Femtometer-level precision in cavity length changes requires advanced interferometric approaches.
Purpose of the Study:
- To demonstrate a novel intracavity phase interferometry technique for measuring small phase shifts.
- To apply this technique for accurate determination of the nonlinear index of refraction.
- To compare the performance of this method against the established z-scan technique.
Main Methods:
- Development and implementation of an intracavity phase interferometry setup.
- Utilizing a synchronously pumped optical parametric oscillator as the light source.
- Measurement of phase shifts as low as 10⁻⁷ radians.
Main Results:
- Successful measurement of phase shifts in the order of 10⁻⁷ radians.
- Demonstration of femtometer-scale precision in detecting cavity length variations.
- Achieved higher accuracy and sensitivity in nonlinear refractive index measurement of lithium niobate compared to the z-scan method.
Conclusions:
- Intracavity phase interferometry is a highly sensitive and accurate method for optical measurements.
- The technique shows significant advantages over traditional methods for nonlinear optical characterization.
- This approach enables precise measurements of material properties at the femtometer scale.

