Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Treatment of C1.1 (AO-41) tibial plateau fracture: A finite element analysis of single medial, lateral and dual plating.

Experimental and therapeutic medicine·2022
Same author

Entropy of Reissner-Nordström 3D Black Hole in Roegenian Economics.

Entropy (Basel, Switzerland)·2020
Same author

Stochastic characterization of phase detection algorithms in phase-shifting interferometry.

Applied optics·2016
Same author

Iterative least square phase-measuring method that tolerates extended finite bandwidth illumination.

Applied optics·2013

Related Experiment Video

Updated: Jun 13, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Self-calibrating lateral scanning white-light interferometer.

Florin Munteanu1

  • 1Veeco Instruments Inc., 2650 E. Elvira Road, Tucson, Arizona 85706, USA. fmunteanu@veeco.com

Applied Optics
|April 23, 2010
PubMed
Summary
This summary is machine-generated.

Lateral scanning white-light interferometry offers continuous large sample scanning. A new self-calibration method eliminates manual tilt angle calibration, improving industrial adoption for optical metrology.

More Related Videos

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
11:57

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)

Published on: December 1, 2016

Related Experiment Videos

Last Updated: Jun 13, 2026

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments
11:47

Characterization of Surface Modifications by White Light Interferometry: Applications in Ion Sputtering, Laser Ablation, and Tribology Experiments

Published on: February 27, 2013

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)
11:57

Three-dimensional Super Resolution Microscopy of F-actin Filaments by Interferometric PhotoActivated Localization Microscopy (iPALM)

Published on: December 1, 2016

Area of Science:

  • Optical Metrology
  • Surface Characterization
  • Interferometry

Background:

  • Standard white-light interferometry (WLI) is limited by the need for stitching procedures when scanning large samples.
  • Lateral scanning white-light interferometry (LSWLI) enables continuous scanning of large samples, overcoming stitching limitations.
  • A significant drawback of LSWLI for industrial use is the requirement for precise tilt angle calibration before each measurement.

Purpose of the Study:

  • To introduce a novel self-calibration approach for lateral scanning white-light interferometry.
  • To eliminate the necessity of pre-measurement tilt angle calibration in LSWLI systems.
  • To enable on-the-fly system adjustments for optimal signal-to-noise ratio without increasing measurement time.

Main Methods:

  • Development of a self-calibration algorithm integrated into the LSWLI system.
  • Utilizing data acquired during the standard scanning process for calibration.
  • Implementing real-time adjustments for system parameters based on acquired data.

Main Results:

  • The proposed method successfully eliminates the need for initial tilt angle calibration.
  • On-the-fly system adjustments are performed without compromising measurement speed.
  • The signal-to-noise ratio is optimized dynamically during the scanning process.

Conclusions:

  • The novel self-calibration approach significantly enhances the practicality of LSWLI for industrial applications.
  • This method removes a key barrier to the widespread adoption of continuous large-sample optical metrology.
  • LSWLI with self-calibration offers a more efficient and user-friendly solution for surface characterization.