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Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
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Measurement of coating thickness with a multiple-beam grating interferometer

J Pedraza-Contreras, O Cardona-Nunez, A Cornejo-Rodriguez

    Applied Optics
    |May 1, 2010
    PubMed
    Summary

    No abstract available in PubMed .

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