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Related Experiment Video

Updated: Jun 13, 2026

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station
05:57

Characterization of SiN Integrated Optical Phased Arrays on a Wafer-Scale Test Station

Published on: April 1, 2020

Optical method of measuring angular displacement using two photodiode arrays

K Sato, S Yamamoto, O Kamada

    Applied Optics
    |May 1, 2010
    PubMed
    Summary

    No abstract available in PubMed .

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