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Updated: Jun 13, 2026

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
Published on: May 18, 2011
Subframe burst gating for Raman spectroscopy in combustion
Jun Kojima1, David Fischer, Quang-Viet Nguyen
1Ohio Aerospace Institute, 22800 Cedar Point Road, Cleveland, Ohio 44142, USA. Jun.N.Kojima@nasa.gov
Abstract:
We describe an architecture for spontaneous Raman scattering utilizing a frame-transfer CCD sensor operating in a subframe burst-gating mode to realize time-resolved combustion diagnostics. The technique permits all-electronic optical gating with microsecond shutter speeds (<5 micros) without compromising optical throughput or image fidelity. When used in conjunction with a pair of orthogonally polarized excitation lasers, the technique measures single-shot vibrational Raman scattering that is minimally contaminated by problematic optical background noise.
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