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Updated: Jun 13, 2026

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy
Published on: May 18, 2011
Subframe burst gating for Raman spectroscopy in combustion
Jun Kojima1, David Fischer, Quang-Viet Nguyen
1Ohio Aerospace Institute, 22800 Cedar Point Road, Cleveland, Ohio 44142, USA. Jun.N.Kojima@nasa.gov
This study introduces a new architecture for spontaneous Raman scattering, enabling rapid, time-resolved combustion diagnostics. The method uses advanced electronic gating for high-speed, clear measurements with minimal noise.
Area of Science:
- Spectroscopy and optical measurement techniques
- Combustion science and engineering
- Advanced sensor technology
Background:
- Spontaneous Raman scattering is a powerful tool for chemical species concentration and temperature measurements in combustion.
- Traditional methods often face limitations in temporal resolution and are susceptible to optical background noise.
- Achieving time-resolved diagnostics in combustion requires high-speed gating capabilities without sacrificing signal quality.
Purpose of the Study:
- To develop and demonstrate a novel architecture for spontaneous Raman scattering.
- To enable time-resolved combustion diagnostics with microsecond shutter speeds.
- To minimize optical background noise for improved measurement fidelity.
Main Methods:
- Utilized a frame-transfer CCD sensor in a subframe burst-gating mode.
- Implemented all-electronic optical gating with shutter speeds below 5 microseconds.
- Employed a pair of orthogonally polarized excitation lasers for vibrational Raman scattering measurements.
Main Results:
- Achieved time-resolved measurements of spontaneous Raman scattering.
- Demonstrated microsecond shutter speeds (<5 micros) without compromising optical throughput or image fidelity.
- Successfully measured single-shot vibrational Raman scattering with minimal contamination from optical background noise.
Conclusions:
- The described architecture provides a robust method for time-resolved combustion diagnostics.
- The all-electronic gating technique offers high temporal resolution and excellent signal quality.
- This advancement facilitates more detailed and accurate studies of combustion processes.
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