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Related Experiment Video

Updated: Jun 13, 2026

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy

Rejection of Fluorescence Background in Resonance and Spontaneous Raman Microspectroscopy

Published on: May 18, 2011

Development of a scanning angle total internal reflection Raman spectrometer.

Kristopher J McKee¹, Emily A Smith

¹Ames Laboratory, U.S. Department of Energy, Ames, Iowa 50011-3111, USA.

The Review of Scientific Instruments

|May 6, 2010

Summary

A new scanning angle total internal reflection (SATIR) Raman spectrometer offers high axial resolution for interfacial analysis. This advanced technique provides a 30-fold improvement over confocal Raman microscopy for chemical specificity.

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Area of Science:

Spectroscopy
Materials Science
Chemical Analysis

Background:

Interfacial phenomena require precise chemical and spatial characterization.
Existing Raman microscopy techniques have limitations in axial resolution.

Purpose of the Study:

To develop a scanning angle total internal reflection (SATIR) Raman spectrometer.
To achieve high axial resolution for probing interfacial phenomena with chemical specificity.

Main Methods:

Utilized an inverted optical microscope with automated variable angle optics.
Employed motorized translation stages for precise control of incident laser angle.
Generated Raman scatter via an evanescent wave at angles exceeding the critical angle.
Collected Raman scatter and reflected light for depth profiling calibration.

Main Results:

Achieved an incident angle range of 25.5-75.5 degrees with 0.05 degrees resolution.
Collected Raman scatter from a ZnSe/organic interface over 35-180 nm.
Obtained an axial resolution of approximately 34 nm, a 30-fold improvement over confocal Raman microscopy.

Conclusions:

The developed SATIR Raman spectrometer enables detailed chemical analysis of interfaces.
Demonstrated significant enhancement in axial resolution for depth profiling.
Opens new possibilities for studying interfacial dynamics and structures.