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Related Concept Videos

IR Spectrometers01:25

IR Spectrometers

There are two main infrared (IR) spectrophotometers: dispersive IR spectrometers and Fourier transform infrared (FTIR) spectrometers. In a dispersive IR spectrometer, a beam of infrared radiation produced by a hot wire is divided into two parallel equal-intensity beams using mirrors. One beam passes through the sample, while another is a reference beam. The beams then move through the monochromator, which separates the radiations into a continuous spectrum of different frequencies. The...
Raman Spectroscopy Instrumentation: Overview01:26

Raman Spectroscopy Instrumentation: Overview

A conventional Raman spectrophotometer includes a laser source, a sample holding system, a wavelength selector, and a detector.
The monochromatic laser source, typically using visible or near-infrared radiation, generates a highly focused beam of light. This light interacts with the molecules of the sample, scattering some of the light. Liquid and gaseous samples are usually tested in ordinary glass capillaries, while solids can be analyzed as powders packed in capillaries or as potassium...

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Updated: Jun 13, 2026

The Frequency Domain Thermoreflectance Technique for Thermal Property Measurements
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Published on: December 5, 2025

Swept wavelength reflectometer for integrated-opticmeasurements.

R I Macdonald, H Ahlers

    Applied Optics
    |May 11, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study details a high-resolution optical reflectometry technique for integrated-optic devices. The method successfully detected surface scratches and end facets in waveguides, demonstrating its potential for device characterization.

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    Published on: September 22, 2017

    Area of Science:

    • Optoelectronics
    • Materials Science
    • Photonics

    Background:

    • Integrated-optic devices require precise characterization of optical features.
    • Existing techniques may lack the resolution for micro-scale imperfections.

    Purpose of the Study:

    • To investigate a novel high-resolution optical reflectometry technique.
    • To assess the technique's capability for characterizing integrated-optic devices.

    Main Methods:

    • Utilized a thermally induced sweep of the sample refractive index.
    • Employed optical reflectometry to detect reflections from waveguide features.

    Main Results:

    • Achieved a resolution of less than 0.2 mm for detecting reflections.
    • Successfully identified surface scratches and end surfaces of Ti:LiNbO(3) waveguides.
    • Demonstrated suitability for characterizing reflections in integrated-optic devices.

    Conclusions:

    • The developed optical reflectometry technique offers high resolution for integrated-optic device analysis.
    • Further improvements in dynamic range are needed for detecting subtle features like bends and Y junctions.
    • Potential avenues for enhancing dynamic range exist and warrant further investigation.