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Absolute reflectometer for the 0.8-2.5-microm region.

D Sheffer, U P Oppenheim, D Clement

|May 11, 2010

Summary

A new absolute reflectometer uses an integrating sphere and computer-controlled filters for automatic measurements. It shows unexpected deviations in BaSO(4) reflectivity compared to accepted values.

Area of Science:

Optical physics
Spectroscopy
Materials science

Background:

Accurate measurement of material reflectance is crucial for various applications.
Existing reflectometry methods may require standard surfaces, limiting absolute measurements.
The 0.8-2.5 micrometer spectral region is important for understanding material properties.

Purpose of the Study:

To describe a novel absolute reflectometer design.
To demonstrate its capability for automatic reflectance measurements.
To evaluate the performance of the reflectometer using Barium Sulfate (BaSO4) as a test material.

Main Methods:

Development of an integrating sphere-based reflectometer.
Operation in the 0.8-2.5 micrometer spectral range.

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Utilizing computer-controlled circular variable filters for automatic wavelength selection.

Employing an absolute measurement technique that does not require a reference standard.

Main Results:

The developed reflectometer provides absolute reflectance values without needing a standard.
The system operates automatically, controlled by computer.
Measurements of Barium Sulfate (BaSO4) in the near-infrared region revealed significant discrepancies from established reflectivity data.

Conclusions:

The novel absolute reflectometer is a functional and automated system for spectral reflectance measurements.
The observed deviations in BaSO4 reflectivity warrant further investigation.
This instrument can potentially uncover new insights into material optical properties.