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Backscattered electron (BSE) imaging of platinum nano-particles dispersed in mesoporous silica

Nobuaki Ikawa1, Mitsuhiko Yamada, Atsushi Miyaki

  • 1National Institute of Advanced Industrial Science and Technology, Higashi 1-1-1, Tsukuba Central 5, Tsukuba, Ibaraki 305-8565, Japan.

Chemical Communications (Cambridge, England)
|May 14, 2010
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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