Scanning Electron Microscopy
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Updated: Jun 12, 2026

Probing Surface Electrochemical Activity of Nanomaterials using a Hybrid Atomic Force Microscope-Scanning Electrochemical Microscope (AFM-SECM)
Published on: February 10, 2021
Frédérique Deiss1, Catherine Combellas, Christian Fretigny
1Groupe Nanosystèmes Analytiques, Institut des Sciences Moléculaires, CNRS UMR 5255, Université Bordeaux 1, ENSCPB, 16 avenue Pey-Berland, 33607 Pessac, France.
A novel multiscaled electrochemical probe for Scanning Electrochemical Microscopy (SECM) was developed. This probe enables precise electrochemical patterning of surfaces by utilizing its unique nanotip array and controlled potential pulses.
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