Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Related Concept Videos

Electronic Distance Measuring Instruments01:30

Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
Distance Measurements by Taping01:18

Distance Measurements by Taping

Tapes are essential in surveying for accurate, durable, and short-distance measurements. Made from lightweight, nylon-coated steel, they offer flexibility and strength for rugged outdoor use. The nylon coating protects against rust and wear, extending the tape's life. Standard lengths, around 30 meters, are marked in meters and millimeters for precision.Surveyors select tapes based on site conditions and accuracy needs. Lightweight, nylon-coated tapes are commonly used for ease of handling and...
Confocal Fluorescence Microscopy01:16

Confocal Fluorescence Microscopy

Confocal microscopy is an advanced microscopic technique. The prime advantage of the confocal microscope over other microscopy techniques is its ability to block the out-of-focus light from the illuminated samples using pinholes. It is widely used with fluorescence optics to obtain high-resolution, sharp contrast images. Unlike optical microscopes, confocal microscopes use a focused beam of light laser to scan the entire sample surface at different z-planes. These microscopes are, therefore,...

You might also read

Related Articles

Articles linked to this work by shared authors, journal, and citation graph.

Sort by
Same author

Polarization-enhanced imaging of photoresist gratings in the real-time scanning optical microscope.

Applied optics·2010
Same author

Optical pattern recognition measurements of trench arrays with submicrometer dimensions.

Applied optics·2010
Same author

Three-dimensional image realization in interference microscopy.

Applied optics·2010
Same author

Phase measurements using the Mirau correlation microscope.

Applied optics·2010
Same author

Differential interference contrast imaging on a real time confocal scanning optical microscope.

Applied optics·2010
Same author

Mirau correlation microscope.

Applied optics·2010
Same journal

Multifunctional reconfigurable terahertz metasurface based on vanadium dioxide phase transition: achieving broadband absorption and efficient polarization conversion.

Applied optics·2026
Same journal

High-Q-factor electromagnetically induced transparency utilizing quasi-bound states in the continuum in an all-dielectric terahertz metasurface.

Applied optics·2026
Same journal

Automated stitching interferometry for high-precision metrology of X-ray mirrors.

Applied optics·2026
Same journal

Experimental demonstration of an approach to designing a metal-dielectric DBR resonant cavity structure.

Applied optics·2026
Same journal

High-precision wavefront reconstruction from a single-shot interferogram using a physics-driven hybrid feature calibration network.

Applied optics·2026
Same journal

Ultra-high-Q Fano resonance based on coupled topological corner states in Kagome photonic crystals.

Applied optics·2026
See all related articles

Related Experiment Video

Updated: Jun 12, 2026

Implementation of a Reference Interferometer for Nanodetection
16:11

Implementation of a Reference Interferometer for Nanodetection

Published on: April 26, 2014

Distance measurements by differential confocal optical ranging.

T R Corle, J T Fanton, G S Kino

    Applied Optics
    |May 22, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel confocal microscopy technique for highly accurate distance measurements. The method enhances ranging accuracy by dithering, proving useful for robotics and precision machining.

    More Related Videos

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
    08:23

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

    Published on: September 30, 2019

    Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells
    09:20

    Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells

    Published on: August 11, 2020

    Related Experiment Videos

    Last Updated: Jun 12, 2026

    Implementation of a Reference Interferometer for Nanodetection
    16:11

    Implementation of a Reference Interferometer for Nanodetection

    Published on: April 26, 2014

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings
    08:23

    A Random-displacement Measurement by Combining a Magnetic Scale and Two Fiber Bragg Gratings

    Published on: September 30, 2019

    Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells
    09:20

    Near Simultaneous Laser Scanning Confocal and Atomic Force Microscopy (Conpokal) on Live Cells

    Published on: August 11, 2020

    Area of Science:

    • Optics and Photonics
    • Metrology
    • Surface Science

    Background:

    • Accurate distance measurement is crucial for applications in robotics, machining, and materials science.
    • Traditional methods can be limited by surface properties like roughness and tilt.
    • Confocal microscopy offers high-resolution depth profiling capabilities.

    Purpose of the Study:

    • To develop a new, highly accurate distance measurement technique using type II confocal systems.
    • To improve ranging accuracy by minimizing sensitivity to surface variations.
    • To demonstrate the technique's applicability for precision measurements and thin film analysis.

    Main Methods:

    • Utilizing the sharply peaked depth response of type II confocal systems.
    • Implementing a dithering mechanism (on sample or optical system) for differential measurement.
    • Generating a zero-crossing at the depth response peak to enhance accuracy.

    Main Results:

    • Achieved high-accuracy distance measurements independent of surface roughness or tilt.
    • Demonstrated sensitivity to surface vibrations as low as 0.01 nm.
    • Successfully performed thin film measurements with accuracy up to 0.04 micrometers.

    Conclusions:

    • The novel dithering technique significantly enhances ranging accuracy in confocal microscopy.
    • This method is robust and applicable to challenging surfaces in industrial settings.
    • The technique provides a powerful tool for nanoscale metrology and transparent film characterization.