Real-time hologram recording in SeGe films

Hologram characteristics of Se(1-x)Ge(x) (x = 0, 3,5,8, 12 wt.%) films were determined in real-time configuration. Parameters such as film thickness, composition, and exposure power influencing the diffraction efficiency were also studied. The maximum value of the diffraction efficiency achieved was 3.2% with 91.0-mW/cm(2) power in films alloyed with 3% Ge. Microstructural changes before and after the exposure were determined using transmission electron microscopy.