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Updated: Jun 12, 2026

Spectral and Angle-Resolved Magneto-Optical Characterization of Photonic Nanostructures
Published on: November 21, 2019
Abstract:
The thickness of a magnetic inert layer on top of a ferrite head sample was measured by probing the longitudinal Kerr effect as a function of the angle of incidence of a laser beam. Our computerized measuring system used a simple single-detector setup to derive polarization information from a Kerr-reflected beam as the incident angle was scanned. The results were analyzed using a general theory of reflection from magnetic stratified media. The experimental results indicate that the possible inert-layer thickness values are given by (50 +/- 10) + 60 x N nm, where the order N equals 0, 1, 2, 3, or 4.
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