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Electronic Distance Measuring Instruments

Electronic Distance Measuring Instruments (EDMs) are essential tools in modern surveying, offering precise distance measurements by emitting electromagnetic signals and calculating the time required for these signals to travel to a target and return. Two primary types of signals are used in EDMs — light waves and microwaves — each suited to specific environmental and distance requirements. Light-wave-based EDMs utilize either infrared or laser light, providing high accuracy over short distances...
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A Multimodal Wide-Field Fourier-Transform Raman Microscope
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Published on: December 30, 2025

Extended unambiguous range interferometry.

T C Strand, Y Katzir

    Applied Optics
    |May 22, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study introduces a novel phase measuring interferometer system that uses fringe contrast to determine absolute phase, eliminating the need for phase unwrapping and improving surface profile accuracy.

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    Area of Science:

    • Optical Metrology
    • Interferometry
    • Surface Profilometry

    Background:

    • Phase measuring interferometers typically measure phase modulo 2pi, requiring phase unwrapping.
    • Surface discontinuities and data dropout can complicate traditional phase measurements.

    Purpose of the Study:

    • To present a new interferometry system for absolute phase determination.
    • To overcome limitations of traditional phase measuring techniques, such as phase unwrapping.

    Main Methods:

    • Utilizing fringe contrast in interference images to determine absolute phase.
    • Implementing a point-by-point phase determination for pipelined processing.
    • Setting up the system on a microscope interferometer for surface profiling.

    Main Results:

    • Achieved absolute phase determination within the coherence length limits.
    • The system is unaffected by surface discontinuities or data dropout.
    • Generated surface profiles over a 512 x 512 point array with a measurement range of 0.5 to 2.5 micrometers.

    Conclusions:

    • The developed system offers a robust method for absolute phase measurement.
    • Eliminates the need for phase unwrapping, simplifying data processing.
    • Pipelined processing enables efficient surface profile generation.