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Related Concept Videos

Interference and Diffraction02:18

Interference and Diffraction

Interference is a characteristic phenomenon exhibited by waves. When two electromagnetic waves interact with their peaks and troughs coinciding, a resulting wave with enhanced amplitude is produced. This is known as constructive interference. In this case, the two waves interacting are in phase with each other.
Angular Velocity and Displacement01:08

Angular Velocity and Displacement

Uniform circular motion is motion in a circle at a constant speed. Although this is the simplest case of rotational motion, it is very useful for many situations and is used to introduce rotational variables. When a particle is moving in a circle, the coordinate system is fixed and serves as a frame of reference to define the particle’s position. Its position vector from the origin of the circle to the particle sweeps out the angle θ, which increases in the counterclockwise direction as the...
X-ray Crystallography02:18

X-ray Crystallography

The size of the unit cell and the arrangement of atoms in a crystal may be determined from measurements of the diffraction of X-rays by the crystal, termed X-ray crystallography.
Diffraction
Diffraction is the change in the direction of travel experienced by an electromagnetic wave when it encounters a physical barrier whose dimensions are comparable to those of the wavelength of the light. X-rays are electromagnetic radiation with wavelengths about as long as the distance between neighboring...
Determination of Crystal Structures01:29

Determination of Crystal Structures

In the late 1800s, the revelation that light extended beyond visible wavelengths led to the discovery of X-rays by Wilhelm Roentgen. Recognized as high-energy electromagnetic radiation with short wavelengths, X-rays prompted exploration into their interaction with crystals. Max von Laue proposed in 1912 that the periodic arrangement of atoms, ions, or molecules in crystals would cause them to diffract X-rays, a hypothesis confirmed through experiments with copper sulfate and zinc sulfide...
Rotational Motion about a Fixed Axis01:26

Rotational Motion about a Fixed Axis

A rigid body's rotation around a fixed axis makes every point within it trace a circular path around a specific line or point. The term given to this type of spinning is defined by the angular position, symbolized by the angle θ. This angle is gauged from a static reference line to the revolving object. From this angular position, any variation is referred to as angular displacement, denoted by dθ. The extent of this displacement can be calculated in degrees, radians, or revolutions, where one...
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Relating Angular And Linear Quantities - I

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Related Experiment Video

Updated: Jun 12, 2026

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
10:39

Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

Published on: October 11, 2016

Optical method of measuring angular displacement using a diffraction pattern.

M Ami, K Sato, S Yamamoto

    Applied Optics
    |May 22, 2010
    PubMed
    Summary
    This summary is machine-generated.

    This study presents a novel method for measuring aperture angular displacement using diffraction pattern analysis. The technique achieves high accuracy, with errors less than 0.050 degrees for in-plane rotations and 0.1 degrees for spherical rotations.

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    Last Updated: Jun 12, 2026

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating
    10:39

    Measurement of X-ray Beam Coherence along Multiple Directions Using 2-D Checkerboard Phase Grating

    Published on: October 11, 2016

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes
    06:56

    Micro/Nano-scale Strain Distribution Measurement from Sampling Moiré Fringes

    Published on: May 23, 2017

    Area of Science:

    • Optical Metrology
    • Diffraction Analysis
    • Precision Measurement

    Background:

    • Accurate measurement of angular displacement is crucial in various optical systems.
    • Traditional methods can be complex or limited in precision for certain applications.
    • Diffraction pattern analysis offers a potential avenue for non-contact, high-resolution measurements.

    Purpose of the Study:

    • To develop and validate a method for measuring angular displacement of an aperture via its rotating diffraction pattern.
    • To assess the accuracy of the proposed method in both planar and spherical coordinate systems.

    Main Methods:

    • Transforming rectangular coordinate diffraction data to polar coordinates.
    • Calculating cross-correlation between rotated and reference diffraction patterns.
    • Simulating angular displacement on a spherical coordinate system using personal computers.

    Main Results:

    • Achieved an error of less than 0.050 degrees for angular displacements within +/-5 degrees in the planar case.
    • Demonstrated an error of less than 0.1 degrees for spherical rotations with azimuth and elevation within +/-6 degrees.

    Conclusions:

    • The proposed diffraction pattern analysis method provides accurate angular displacement measurements.
    • The technique is effective for both in-plane and complex spherical rotations.
    • This method offers a precise and potentially versatile tool for optical metrology applications.