Advantages of aberration correction for HRTEM investigation of complex layer compounds

E Spiecker1, M Garbrecht, W Jäger

  • 1Mikrostrukturanalytik, Institut für Materialwissenschaft, Christian-Albrechts-Universität zu Kiel, D-24143 Kiel, Germany. Erdmann.Spiecker@ww.uni-erlangen.de

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