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Microstructure investigations of dental composite samples prepared by focused ion beam technique

M Andrzejczuk1, J Siejka-Kulczyk, M Lewandowska

  • 1Faculty of Materials Science and Engineering, Warsaw University of Technology, Warszawa, Poland. mandrzejczuk@inmat.pw.edu.pl

Journal of Microscopy
|May 27, 2010
PubMed

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Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
Fundamental Principles
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