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Related Concept Videos

Atomic Emission Spectroscopy: Overview01:20

Atomic Emission Spectroscopy: Overview

Atomic emission spectroscopy (AES) is an analytical technique used to determine the elemental composition of a sample by analyzing the light emitted from excited atoms. In AES, atoms in a sample are excited to higher energy levels by thermal energy from high-temperature sources, such as plasma, arcs, or sparks. When these excited atoms return to lower energy states, they emit light at specific wavelengths characteristic of each element. The resulting atomic emission spectrum, which consists of...
Atomic Emission Spectroscopy: Lab01:29

Atomic Emission Spectroscopy: Lab

AES is a powerful analytical technique, especially effective when used with plasma sources, producing abundant spectra in characteristic emission lines. The Inductively Coupled Plasma (ICP), in particular, yields superior quantitative analytical data due to its high stability, low noise, low background, and minimal interferences under optimal experimental conditions. However, newer air-operated microwave sources are emerging as promising alternatives that could be more cost-effective than...
Atomic Emission Spectroscopy: Instrumentation01:22

Atomic Emission Spectroscopy: Instrumentation

The instrumentation of atomic emission spectrometry (AES) involves various components, including atomization devices that convert samples into gas-phase atoms and ions. There are two main types of atomization devices: continuous and discrete atomizers.  Continuous atomizers, like plasmas and flames, introduce samples in a constant stream, while discrete atomizers inject individual samples using syringes or autosamplers. The most common discrete atomizer is the electrothermal atomizer.
Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation01:26

Inductively Coupled Plasma Atomic Emission Spectroscopy: Instrumentation

Inductively coupled plasma (ICP) is the common plasma source used in atomic emission spectroscopy (AES), a technique that detects and analyzes various elements in a sample. This method is often called inductively coupled plasma atomic emission spectroscopy (ICP-AES).
There are three main types of inductively coupled plasma atomic emission spectroscopy  (ICP-AES) instruments: sequential, simultaneous multichannel, and Fourier transform instruments, with the latter being less commonly used.
Atomic Fluorescence Spectroscopy01:29

Atomic Fluorescence Spectroscopy

Atomic fluorescence spectroscopy (AFS) is an analytical technique that involves the electronic transitions of atoms in a flame, furnace, or plasma being excited by electromagnetic (EM) radiation. When these atoms absorb energy, they become excited and subsequently release energy as they return to their original state. This emitted light, or "fluorescence," is observed at a right angle to the incident beam. Both absorption and emission processes transpire at distinct wavelengths, which are...
Scanning Electron Microscopy01:07

Scanning Electron Microscopy

A scanning electron microscope (SEM) is used to study the surface features of a sample by using an electron beam that scans the sample surface in a two-dimensional manner. Typically, areas between ~1 centimeter to 5 micrometers in width can be imaged. SEM can be used to image bacteria, viruses, tissues as well as larger samples like insects. Conventional SEM gives a magnification ranging from 20X to 30,000X and spatial resolution of 50 to 100 nanometers.
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples
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Synchrotron X-ray Microdiffraction and Fluorescence Imaging of Mineral and Rock Samples

Published on: June 19, 2018

Improved micro x-ray fluorescence spectrometer for light element analysis.

Stephan Smolek1, Christina Streli, Norbert Zoeger

  • 1Atominstitut, Vienna University of Technology, Stadionallee 2, 1020 Vienna, Austria.

The Review of Scientific Instruments
|June 3, 2010
PubMed
Summary
This summary is machine-generated.

A new micro-X-ray fluorescence (micro-XRF) spectrometer analyzes light elements (Z >= 6) under vacuum. This system achieves picogram detection limits and demonstrates advanced mapping capabilities for elemental analysis.

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Area of Science:

  • Materials Science
  • Analytical Chemistry
  • Physics

Background:

  • Standard micro-X-ray fluorescence (micro-XRF) spectrometers are limited to analyzing elements with atomic numbers (Z) greater than 14 due to air absorption.
  • Analysis of light elements (Z <= 14) is crucial for various scientific and industrial applications.

Purpose of the Study:

  • To design and characterize a specialized micro-XRF spectrometer capable of analyzing light elements (Z >= 6).
  • To improve excitation and detection conditions for enhanced light element sensitivity.
  • To demonstrate the spectrometer's mapping capabilities for elemental distribution.

Main Methods:

  • The developed spectrometer operates under vacuum conditions to minimize absorption of X-ray radiation.
  • Automated sample mapping is controlled by specialized computer software.
  • Spectrometer performance was evaluated using Cu wire, thin metal foils, NIST621 standard reference material, a laser print, and NaF droplets.

Main Results:

  • The spectrometer achieved a spot size of 31 microm (FWHM) for Mo Kalpha line and effective beam sizes of 44 microm (Cu K edge) and 71 microm (Cu L edge).
  • Picogram-level detection limits (per spot) were obtained for light elements.
  • Parts per million (ppm) detection limits were achieved for the NIST621 standard reference material.
  • Successful area scans demonstrated the system's capability for microscopic elemental mapping.

Conclusions:

  • The specialized vacuum micro-XRF spectrometer effectively extends analytical capabilities to light elements.
  • The system offers high sensitivity and spatial resolution for elemental analysis.
  • The developed instrument is suitable for detailed elemental mapping of microscopic samples.